The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 1989
Filed:
Oct. 01, 1985
Kazushige Inoue, Ibaraki, JP;
Hiroshi Yamamoto, Uji, JP;
Hiroshi Hyodo, Kyoto, JP;
Shinichi Kishimoto, Kuze, JP;
Kabushiki Kaisha Kyoto Daiichi Kagaku, Kyoto, JP;
Abstract
An autonomous continuous analysis method and apparatus using Dip and Read type analytical implements. A series of operations of taking out analytical implements, dipping them in the sample solution, optical measurement, calculation, and disposal of the used sample solution are performed automatically. The dip stage, in particular, is automated by use of an analytical-implement automatic supply device and an analytical implement automatic handling device which, holding an analytical implement, dips it in the sample solution, and sets it ona reaction turntable. A number of analytical implements are put in a storage section comprising a bottom section provided with an analytical implement groove and at least one inside surface which is parallel with the groove, are taken out one by one by the relative movement of the groove and in normal and reverse direction and by stopping in a specified position after confirming by a detector that an implement has been caught in the groove.