The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 1989
Filed:
Dec. 04, 1987
Hideo Watanabe, Ibaraki, JP;
Yoshiaki Kurata, Ibaraki, JP;
Komori Printing Machinery Co., Ltd., Tokyo, JP;
Abstract
There is disclosed a measurement position synchronization method applied to a scanning densitometer to photoelectrically scan a control strip comprising a plurality of color patches of respective colors printed on a paper to thereby calculate densities of the color patches every respective colors. This method comprises: the steps of responding to a measured values obtained by scanning a color patch of a specified color to calculate points which have varied respectively by predetermined values on the side of a reference level included in the measured values; determining the intermediate point of the both points calculated to be an actual measurement central point of the color patch of the specified color; and carrying out synchronization of measurement positions in accordance with a difference between a scheduled central point and the actual measurement central point. This method is applicable also to a scanning densitometer to photoelectrically scan a control patch comprising a plurality of color patches of respective colors printed on a paper and formed every ranges divided in a transverse direction to thereby calculate densities of the color patches every said ranges and every respective colors.