The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 1989

Filed:

Aug. 19, 1988
Applicant:
Inventors:

David J Luttmer, Glenshaw, PA (US);

Thomas L Panian, Allison Park, PA (US);

Barry D Wixey, Pittsburgh, PA (US);

Raymond L Wilson, Pittsburgh, PA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33706 ; 33DI / ; 33784 ;
Abstract

Disclosed is a capacitive measurement system. The system comprises structure for generating a plurality of waveforms, a calibrated reference member for use with a reader head in making a measurement, and a reader element configured for lateral movement with respect to the calibrated reference member. The calibrated reference member comprises one element of a capacitor. The reader element comprises a plurality of reader regions comprising the other element of the capacitor. The reader element also includes structure for receiving two signals resulting from coupling of the two capacitor elements. The system functions to detect a phase shift level between the two signals and to determine magnitude of lateral movement in a particular direction from the magnitude of the phase shift.


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