The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 1989
Filed:
Jan. 27, 1988
Craig V Johnson, Everett, WA (US);
John Fluke Mfg. Co., Inc., Everett, WA (US);
Abstract
A method of and system of high-speed, high-accuracy functional testing of memories in microprocessor-based units or boards under test includes a test system that is effectively permanently coupled to the unit under test bus structure during test execution and operates at the unit under test's clock rate. The test program may be stored in the unit under test's own memory, or may be electrically transferred from the test system's memory to the memory under test using a memory overlay technique. Memory testing speed may be further incresed by taking advantage of block move and compare features of newer microprocessors. An algorithm which exploits the block move and compare features is provided.