The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 1989
Filed:
May. 27, 1987
Peter Van Der Meulen, Eindhoven, NL;
U.S. Philips Corp., NY, NY (US);
Abstract
In NMR images, which are constructed from resonance signals, for example with Fourier zeugmatography, due to coherent interferences, for example, as a result of 'leak-through' of NMR signals from one sequence to a next sequence of resonance signals, artefacts can occur in the images, which, depending upon the kind of interference, become manifest in the image as interference lines, ghost images or conspicuous dots. A method is disclosed of reducing the influence of these interferences by smearing the artefacts out over the image as noise. For this purpose, the phase of the reference signals is randomly modulated between measuring cycles of the resonance signals. The reference signal is used to form excitation pulses for producing resonance signals in a body and further in synchronous detection of the resonance signals.