The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 1989
Filed:
Aug. 02, 1988
Toshio Koshihara, Tokyo, JP;
Rokurou Misawa, Tokyo, JP;
Yuzo Sagawa, Tokyo, JP;
Kimio Takehara, Tokyo, JP;
Yuji Matoba, Tokyo, JP;
Koji Ishihara, Tokyo, JP;
NKK Corporation, Tokyo, JP;
Abstract
A method and an apparatus for detecting a defective portion on the inner surface of a pipe, the outer surface of which is exposed, includes: heating or cooling a pipe, the outer surface of which is exposed, from the side of the outer surface thereof so that a difference in temperature is produced between a portion of the outer surface of the pipe corresponding to an accumulation of foreign matters or a thinner portion as a defective portion on the inner surface thereof, and a portion of the outer surface of the pipe corresponding to a normal portion of the inner surface thereof; then shooting the outer surface of the pipe by means of a thermal imaging system while the above-mentioned difference in temperature still remains on the outer surface of the pipe to obtain a thermal image of the difference in temperature; and detecting the accumulation of foreign matters or the thinner portion as the defective portion of the inner surface of the pipe by means of the thus obtained thermal image.