The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 1989

Filed:

Mar. 07, 1988
Applicant:
Inventor:

Michael Kuchel, Oberkochen, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim/Brenz, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356360 ;
Abstract

For generating several interferograms which differ from each other in the relative phase position between the interfering partial beams, a light source is utilized having a coherence length less than the optical path difference between the two component beams in the measuring path of the interferometer. Furthermore, at least one optical delay device is provided which splits the beam into two component beams and which generates an optical path difference between these component beams which is approximately the same as the optical path difference of the partial beams in the measuring path of the interferometer. Thereafter, the delay device again unites the component beams congruently.


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