The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 1989

Filed:

Nov. 16, 1988
Applicant:
Inventors:

Stanton D Smith, Bellport, NY (US);

David Hertz, Dix Hills, NY (US);

Robert B Wolf, Medford, NY (US);

Robert H Olsen, Bethpage, NY (US);

Assignee:

Fonar Corporation, Melville, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ;
Abstract

An apparatus for obtaining, in the course of a single scan, NMR image data for a plurality of selected planes in an object, oriented at different angles, utilizes a slice pointer for outputting a signal indicating a particular plane to a multiplier and offset parameter RAM which provides multiplier and offset terms corresponding to the angle of the plane. A generator provides a generic gradient waveform to an arithmetic unit which combines this waveform with the multiplier and offset parameters from the RAM to create waveforms, which when applied to the gradient coils of an NMR apparatus, rotate the slice selector and the readout gradients, thereby permitting image data to be obtained in planes having different angles. A method in accordance with the apparatus of the present invention is also disclosed.


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