The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 1989
Filed:
Aug. 18, 1988
Hubert F Elbert, Tuscon, AZ (US);
Gary March-Force, Benson, AZ (US);
Apex Microtechnology Corporation, Tucson, AZ (US);
Abstract
An environmental testing facility for verifying operational conditions of electronic components at predefined temperature extremes is described. A removable multistation holder is configured to have a plurality of components coupled thereto. The multistation holder is coupled to a controllable, rotatable shaft. A hood is placed over the holder, shaft and associated apparatus and placed in contact with a base plate, so that a vacuum can be established in the resulting chamber. A sensing device permits the positioning of the individual components with respect to an interface apparatus. When the component is correctly positioned with respect to the interface apparatus, the interface apparatus is moved to engage the terminals of the components. The electrical signals can be applied to and received from the component through the interface device. After a first temperature condition is established for the multistation holder and consequently for the components coupled thereto, all of the components are tested. Thereafter, the components are tested at the second temperature condition. The testing apparatus is operated under control of data processing circuits that can apply and receive signals from the components for operation evaluation and can automatically position the components with respect to the interface apparatus, and can provide appropriate signals for a sequence of the testing procedure.