The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 1989

Filed:

Oct. 05, 1988
Applicant:
Inventor:

Georg Geus, Wiesbaden, DE;

Assignee:

Heimann GmbH, Wiesbaden, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 87 ; 378 62 ; 378 90 ;
Abstract

An article inspection system has separate detectors for primary radiation and scattered radiation which are generated by an article upon being irradiated with X-radiation. The scattered radiation detector is disposed so that no primary radiation is incident thereon. The primary radiation detector is scanned at a frequency to produce a primary radiation image. The scattered radiation incoming to the scattered radiation detector is modulated at a frequency synchronized with the scanning frequency for the primary radiation detector, so that only scattered radiation is incident on the scattered radiation detector which emanates from the region of the article which is currently being scanned for primary radiation.


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