The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 1989

Filed:

May. 01, 1987
Applicant:
Inventors:

Samim Anghaie, Gainesville, FL (US);

Nils J Diaz, Gainesville, FL (US);

Assignee:

Florida Nuclear Associates, Inc., Gainesville, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 87 ; 378 58 ;
Abstract

A collimated beam of gamma radiation is applied to a test object under non-destructive examination to produce a scattered gamma radiation field within which detectors are positioned to provide radiation energy level data of the field. Such measurement data is processed by comparison with reference data from a flawless object to provide differential scatter gamma spectra. The differential spectra are transformed by spatial/energy data processing to extract accurate location and size data with respect to any flaws present in the test object.


Find Patent Forward Citations

Anghaie, Samim. (1989). Gamma ray flaw detection system (U.S. Patent No. 4870669). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4870669

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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