The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 1989

Filed:

Jan. 04, 1989
Applicant:
Inventors:

Youichi Hayashi, Kanagawa, JP;

Kazuo Kubota, Kanagawa, JP;

Masaaki Sakaguchi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
250570 ; 2502 / ; 356429 ;
Abstract

A method for inspecting a tape splice for defects in which the splice region between two sheets is irradiated with a light beam, the tapes are longitudinally conveyed relative to the light beam, a one-dimensional light detector means receives the portion of the light beam transmitted or reflected by a linear region of the sheets inclined at a prescribed angle to the transverse direction of the sheets, and the presence/absence of a splice defect is discriminated from change or lack of change in the quantity of light received by the light detector means; and an apparatus for carrying out this method.


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Hayashi, Youichi. (1989). Splice inspection method and apparatus using light inclined at a (U.S. Patent No. 4870291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4870291

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