The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 1989

Filed:

Feb. 19, 1988
Applicant:
Inventors:

Marshall H Scott, Woodinville, WA (US);

Robert E Cuckler, Bothell, WA (US);

John D Polstra, Seattle, WA (US);

Anthony R Vannelli, Everett, WA (US);

W Douglas Hazelton, Everett, WA (US);

Assignee:

John Fluke Mfg. Co., Inc., Everett, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
371 16 ; 364200 ;
Abstract

A method and system for testing and troubleshooting microprocessor-based electronic systems employs memory emulation techniques as well as other techniques to provide complete functionality tests and fault location. Fine-resolution sync pulses may be generated at preselected time positions during a bus cycle of interest to facilitate full troubleshooting fault isolation. Other features include bus testing using memory emulation techniques, using the chip select line of ROMs to encode test results, and techniques that keep a target microprocessor functioning in a system in which the kernel is dead.


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