The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 1989
Filed:
Aug. 13, 1987
Applicant:
Inventors:
Assignee:
Seiko Seiki Kabushiki Kaisha, , JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
369 53 ;
Abstract
The present invention provides an inspection apparatus for inspecting an object such as an information storage medium or an information recording/reproducing head under set inspection conditions, which comprises: a sensor for identifying the type of object set for inspection by its size, and automatic inspection condition setting means for automatically setting the inspection conditions for the object to be inspected which are associated with the type identified.