The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 1989
Filed:
Feb. 26, 1988
Applicant:
Inventor:
Takashi Kanazawa, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ; H04Q / ; G11C / ;
U.S. Cl.
CPC ...
307244 ; 307463 ; 328137 ; 328152 ; 377 77 ;
Abstract
For a plurality of logic units which are organized into scan-path groups, a scan-path self-testing circuit is provided which comprises a clock source and a plurality of gates for supplying the clock pulse to the logic units when selectively enabled. To give flexibility to group organization of the logic units, the gates are provided in a one-to-one relationship with the logic units. Bit positions of a register are associated respectively with the gates. A scan path controller selects one of the scan-path groups and writes a logic 1 into the register bit positions which are associated with the logic units of the selected scan-path group.