The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 1989

Filed:

Dec. 22, 1988
Applicant:
Inventors:

Kanehiro Sorimachi, Yokohama, JP;

Shigeru Yamada, Chofu, JP;

Yasurou Sakamoto, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356-2 ;
Abstract

Apparatus and method for obtaining three-dimensional information about an object, includes a first optical system, a projection device, a second optical system, and an image sensor. A plurality of pattern beams are radiated onto the object through the first optical system. Optical images formed by the pattern beams on the object are received by the image sensor through the second optical system to detect the positions of the received optical images. The distances from the detected positions of the optical images to a plurality of positions on the object are measured, thereby obtaining three-dimensional information about the object.


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