The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1989

Filed:

Aug. 29, 1986
Applicant:
Inventors:

John S Shenk, State College, PA (US);

Mark O Westerhaus, State College, PA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
36457102 ; 73 / ; 364525 ; 356124 ;
Abstract

In a calibration system for optical instruments of the type which make measurements at incrementally spaced wavelengths throughout a spectrum, a plurality of standard samples are measured by a master instrument and a field instrument. The measurement data obtained from each instrument are then statistically correlated to determine a calibration file which is stored with the field instrument. The calibration file includes identification on the field instrument of index locations at which the field instrument will respond to the same wavelength as corresponding index points on the master and includes correction coefficients for each of the index locations. The calibration file is stored in a computer connected to the field instrument and the computer is provided with a program to correct the measurements made by the field instrument in accordance with the stored calibration file.


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