The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1989

Filed:

Oct. 28, 1988
Applicant:
Inventor:

Klaus Weber, Konigsbronn, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250571 ; 356371 ;
Abstract

A surface waviness measuring apparatus for specularly reflecting surfaces has a light source (22) and an optical system (23) which directs a light beam (24) obliquely onto the surface (14), with the light beam (24) forming a small primary light bead (12) there. A spherical concave mirror (11) is arranged at the angle of reflection (.alpha.) with the center of curvature (13) of the spherical concave mirror being arranged closely adjacent the small primary light bead (12) on the reflecting surface (14). A photoreceiver arrangement (16) is located at the angle of reflection of the light beam (15) reflected from the concave mirror (11).


Find Patent Forward Citations

Weber, Klaus. (1989). Optical surface waviness measuring apparatus (U.S. Patent No. 4866287). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4866287

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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