The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1989

Filed:

Nov. 03, 1988
Applicant:
Inventors:

Yuichi Hosoi, Kanagawa, JP;

Kenji Takahashi, Kanagawa, JP;

Nobufumi Mori, Kanagawa, JP;

Masaru Noguchi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; G03B / ;
U.S. Cl.
CPC ...
2503272 ; 250397 ; 2504841 ;
Abstract

An apparatus for recording and reproducing an image of a specimen produced by an electron microscope includes a two-dimensional image sensor for storing the energy of an electron beam having passed through the specimen, a stimulating system for scanning the two-dimensional image sensor with stimulating energy to discharge the stored electron beam energy as light from the two-dimensional image sensor, a photoelectric transducer for photoelectrically detecting the light discharged from the two-dimensional image sensor, and an erasing system for applying erasing energy to the two-dimensional image sensor to discharge energy remaining thereon after the light has been photoelectrically detected.


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