The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1989
Filed:
Oct. 31, 1988
V Warren Biricik, Palos Verdes Estates, CA (US);
Frank R Nakatsukasa, Gardena, CA (US);
Northrop Corporation, Hawthorne, CA (US);
Abstract
Method and apparatus for high accuracy measurement of non-reciprocal reflectivity of magnetic thin film materials and magnetic mirrors. An ellipsometer which employs a Helmholtz coil to supply magneto-optic modulation to p-polarized light and an acousto-optic modulator to provide intensity modulation is utilized in conjunction with a novel scheme of analyzer rotation and computational techniques to accurately measure non-reciprocal reflectivity. A microcomputer is used to provide controlled rotation of polarizing elements, data logging, data analysis, and output. The non-reciprocal reflectivity value is determined by the slope of the measured ratio of magneto-optically modulated and absolute intensities (.delta.I.sub.magnetic /I.sub.total), plotted against a function of the analyzer angle G(.PSI.).