The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1989
Filed:
Feb. 09, 1988
Applicant:
Inventors:
Jan E van der Werf, Eindhoven, NL;
Johannes W Biesterbos, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
250201 ; 356-4 ;
Abstract
An optical imaging arrangement is described which comprises an opto-electronic focussing-error detection system (1, 2, 3, 4, 5, 6, 12, 13, 14, 18, 19, 20, 21) for determining a deviation between the image plane (P.sub.L) of the imaging system (L) and a second plane (P.sub.S) in which the image is to be formed. The image plane (P.sub.F) of the focussing-error detection system is adjustable, for example by means of a pivotable plane-parallel plate (15), so that the zero point of the focussing-error signal (S.sub.f) is adjustable.