The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1989
Filed:
Dec. 23, 1988
Applicant:
Inventors:
Kazuhiko Matsuoka, Yokohama, JP;
Masayuki Usui, Yokohama, JP;
Kazuo Minoura, Yokohama, JP;
Takeshi Baba, Yokohama, JP;
Atsushi Someya, Machida, JP;
Yukuo Nishimura, Sagamihara, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350353 ; 350355 ; 350418 ; 350419 ;
Abstract
A variable aberration imaging optical system comprises an imaging optical system and an optical device disposed in the optical system and capable of controlling the imaging characteristic of the imaging optical system. The optical device has a medium for forming an index gradient therein by heat, and a device for imparting heat to a desired position on the medium.