The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1989
Filed:
Nov. 09, 1987
Arthur Rich, Ann Arbor, MI (US);
James C Van House, Ann Arbor, MI (US);
The University of Michigan, Ann Arbor, MI (US);
Abstract
A positron microscope system utilizing image enhancement to overcome problems associated with low positron source flux can be operated in transmission and reflection modes. In the practice of the invention, slow positrons which are emitted after moderation of a positron source are focused, as a source beam, on a specimen target. In some embodiments, the source beam is swept over the specimen target, to effect scanning thereof. Image enchancement is effected by a channel electron multiplier array (CEMA) which may have a plurality of plates. The cloud of electrons which is generated by a CEMA in response to each incident positron is accelerated toward a long persistence phosphor screen. Image acquisition is achieved by a low light video system which delivers its signal to a memory which stores the data. The data is subsequently subjected to an image analysis algorithm which facilitates accumulation and signal averaging. In one system according to the invention, secondary electrons generated in response to incidence of positrons on a specimen target are imaged, and such imaging may employ information obtained from detection of gamma rays.