The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1989
Filed:
Jun. 07, 1988
Hitachi, Ltd., Tokyo, JP;
Abstract
A photoanalysis apparatus includes marker pouring device for pouring markers into one of sheath fluid and fluid carrying particles in a flow-cell device, second optical device for applying a light beam for correction to the markers in the flow-cell device to measure strength of fluorescence or light scattering caused by said markers to generate a signal for correction, second signal processing device for calculating from the signal for correction at least one of a difference in position between a center of the fluid carrying particles in the flow-cell device and a center of a light beam for examination and a difference in flow rate between a predetermined flow rate and an actual flow rate of the fluid carrying particles in the flow-cell device to generate correspondingly at least one of a first command signal for position correction and a second command signal for flow rate correction, and correspondingly at least one of first correcting device for shifting the center of the light beam for examination to the center of the flow of the fluid carrying particles in accordance with the first command signal and second correcting device for correcting the flow rate of the fluid carrying particles to the predetermined flow rate in accordance with the second command signal.