The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1989
Filed:
Mar. 10, 1988
Pieter M Houpt, The Hague, NL;
Arie Draaijer, Zwijndrecht, NL;
Abstract
Confocal laser scanning microscope comprising a laser as point light source, a deflection system for the line and frame scanning and a lens system, at least one objective near the object, an object stage, a spatial filter and a detector, and an electronic control and imaging-processing system. The object is scanned point by point by the light beam and measurement is made with the detector only where the point light source is focused so that out-of-focus light is not detected. As a result resolution and contrast in three dimensions, in particular, axially to the image plane can be improved considerably, and 3D information can be derived from the object. For the more rapid line scanning, the deflection system of the present invention comprises an acousto-optical deflector and comprises for the slower frame scanning, another deflector constructed in a manner such that at least the frame-scanning movement of the return light beam is completely eliminated, as a result of which the return light is focused on the spatial filter.