The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 1989

Filed:

Apr. 19, 1988
Applicant:
Inventors:

Toshio Iino, Ibaraki, JP;

Takayuki Kai, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33522 ; 33548 ; 33552 ;
Abstract

An apparatus for simultaneously measuring at least the width and thickness of a seamed portion of a can at the same point on the seamed portion. The apparatus comprises a measurement base for receiving the seamed portion of the can thereon, and a reference block secured to the measurement base the reference block including a reference contact portion to contact the outer surface of the seamed portion. A device for measuring the width of the seamed portion is mounted on the reference block and includes a measurement pin cooperating with the measurement base to clamp the seamed portion in the vertical direction. A device for measuring the thickness of the seamed portion is mounted on the reference block and includes a measurement block cooperating with the reference contact portion to clamp the seamed portion laterally. The apparatus may further comprise a device for measuring the can height and/or a device for measuring the countersink depth.


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