The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 1989

Filed:

Dec. 24, 1987
Applicant:
Inventors:

Yasufumi Fukuma, Tokyo, JP;

Ikuo Kitao, Tokyo, JP;

Yasuo Kato, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ; 351212 ;
Abstract

An eye testing apparatus, in which a cornea reflecting image and a retina reflecting image formed by projecting each target mark image onto a cornea and a retina of an eye to be tested are projected to a slight receiving portion through a measuring optical system, and in which a corneal configuration and a refractive power of the eye to be tested are measured according to a signal detected by the light receiving portion, characterized in that the light receiving portion includes a two-dimensional light receiving element, the measuring optical system simultaneously projecting the cornea reflecting image and the retina reflecting image to different areas of the two-dimensional light receiving element.


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