The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 1989

Filed:

Dec. 24, 1985
Applicant:
Inventors:

Dobson Okawa, Anaheim, CA (US);

Wing S Pang, West Covina, CA (US);

Dang Ngo, Cypress, CA (US);

George Shibata, Chino, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ; G01K / ;
U.S. Cl.
CPC ...
364557 ; 364550 ; 422 63 ; 422 67 ; 374 11 ; 374112 ; 236 / ;
Abstract

Apparatus for controlling reaction temperatures in a chemical analyzer comprises a thermoelectric element operating in response to a temperature sensor, and control means capable of predicting a setpoint deviation for a future time period, and, when an overshoot is predicted, reducing a control signal for the element by an amount proportional to a current setpoint deviation. The apparatus includes at least one reaction cell and a buffer unit for thermally stabilizing a fluid that is fed, on demand, into the reaction cell, the cell and the buffer unit having separate thermoelectric elements and sensors. A microcomputer control system generates independent control signals for the elements.


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