The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 1989
Filed:
Jul. 17, 1987
Applicant:
Inventor:
Yoshihiro Takiguchi, Shizuoka, JP;
Assignee:
Hamamatsu Photonics Kabushiki Kaisha, Shizuoka, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250560 ; 2502 / ; 356376 ;
Abstract
An apparatus for optically measuring a three-dimensional surface shape and inner structure of a three-dimensional object without destruction of the object. When a light pulse having a short pulse width is applied to the object, there are observed a flux of light pulses reflected from or transmitted through the object which has information on the three-dimensional surface shape and inner structure of the object. This apparatus optically measures and analyzes in the order of a picosecond the intensity distribution of the light pulses from the object with time and space, to thereby obtain a complete three-dimensional image of the object.