The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 1989

Filed:

May. 02, 1988
Applicant:
Inventors:

John Pidorenko, Ypsilanti, MI (US);

Alan R Hoffman, Chagrin Falls, OH (US);

Robert F Hodge, Kent, OH (US);

Wei-Min Wang, Ypsilanti, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73 / ; 73705 ; 36457104 ; 36457107 ;
Abstract

A system and method for initializing and calibrating a fiber optic pressure transducer so that a measured intensity of light which varies as a function of pressure can be accurately translated to the value of pressure which produces that value of light intensity. The transducer includes an enclosed sensor tip having a diaphragm which is exposed to atmospheric pressure on the inside and the pressure to be determined on the outside as measurements are taken, the resulting pressure differential producing a related attenuation in light intensity. Calibration according to the present invention is performed by exposing the diaphragm to atmospheric pressure on the outside and sub-atmospheric pressure on the inside while transmitting light through the fiber in the usual manner. The sub-atmospheric pressure is changed gradually as simultaneous measurements are made of the intensity of light returned through the fiber and the actual value of the sub-atmospheric pressure at a number of discrete times. The paired values are stored in a look-up table which is subsequently used to determine unknown pressures from matched values of measured light intensity.


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