The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 1989
Filed:
Nov. 16, 1987
Applicant:
Inventors:
Padmakar P Lele, Winchester, MA (US);
Gerard E Sleefe, Cedar Crest, NM (US);
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
36441325 ; 73602 ; 12866006 ; 12866007 ; 36441315 ;
Abstract
Methods and devices for characterizing tissues and the like utilize signals obtained from ultrasonic backscatter processes. The method accounts for frequency-dependent attenuation, spatially-varying media statistics, arbitrary beam geometries, and arbitrary pulse shapes. Statistical analysis is employed to estimate the scatterer number density (SND) of tissues. The method for estimating the scatterer number density incorporates measurements of both the statistical moments of the backscattered signals and the point spread function of the acoustic system.