The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 1989

Filed:

Sep. 22, 1988
Applicant:
Inventors:

Richard L Lemaster, Pinole, CA (US);

David A Dornfeld, Berkeley, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73587 ; 73801 ; 73 3 / ;
Abstract

Method and apparatus for evaluating the density profile of a wood-derived specimen. A sample of the material is mounted on a lathe and rotated at high speed. An acoustic emission transducer is coupled to a cutting tool, brought into contact with the specimen to produce an AE signal, as the tool is moved across the thickness of the rotating sample. The acoustic emission signal is then transformed into an electrical signal and the resultant electrical signal is amplified and transmitted to a second amplifier for further amplification and analysis of the signal.


Find Patent Forward Citations

Lemaster, Richard. (1989). Method and apparatus for measurement of density profiles in wood (U.S. Patent No. 4854172). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4854172

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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