The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 1989
Filed:
Jan. 13, 1988
Applicant:
Inventors:
Mamoru Miyawaki, Tokyo, JP;
Kazuya Matsumoto, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 46 ; 369 44 ; 369112 ;
Abstract
This specification discloses an information processing method and apparatus in which light deflected by diffraction is caused to arrive at the surface of a recording medium and when recording or reproduction of information is to be effected by effecting focus control or tracking control of the deflected light on the surface of the recording medium by the utilization of the O-order light in the diffraction, the deflected light can be moved at a high speed on the recording medium and accurate focus or tracking control of the deflected light is possible.