The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1989

Filed:

May. 27, 1988
Applicant:
Inventor:

Johannes J Cuppen, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

A method is proposed for reducing the residual artefacts, such as blurring, which occurs in the image when the known methods are used, for example due to phase errors. In accordance with the proposed method, a number of steps are performed per column in the data matrix so as to produce an ever better estimation for the data not known from sampling. After the reconstruction, the image will have a phase which at least approximates the phase estimated from the central part of the data matrix. In the case of phase errors, substantially no residual artefacts will remain and at the same time the signal-to-noise in the image will be superior to that obtained by means of the known methods.


Find Patent Forward Citations

Cuppen, Johannes. (1989). Method of reconstructing a nuclear magnetization distribution from a (U.S. Patent No. 4853635). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4853635

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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