The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1989

Filed:

Aug. 14, 1987
Applicant:
Inventor:

Bengt H Tornblom, Vaster.ang.s, SE;

Assignee:

Tornbloms Kvalitetskontroll AB, Vaster.ang.s, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324226 ; 324227 ; 324232 ;
Abstract

An electrical defect testing device for a non-magnetic test object, for example crack detection on hot continuously cast billets, is provided with means for detecting and suppressing the influence of disturbing magnetic regions of the object (e.g. regions of cold oxide scale). The device comprises at least one sensing transducer for harmful faults which is adapted to move relative to the test object. At least one detector is associated with the transducer for identifying the presence of magnetic material, and a blocking circuit is provided which, directly or indirectly, is controlled by the magnetic detector and is used for suppressing signals originating from a fault vector, for example a signal indicating a harmful fault. The presence of magnetic material can be detected using an eddy current technique.


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