The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1989

Filed:

Oct. 27, 1987
Applicant:
Inventors:

Hermann B Sequeira, Baltimore, MD (US);

Michael W Trippe, Baltimore, MD (US);

Rajendra S Jakhete, Catonsville, MD (US);

Assignee:

Martin Marietta Corporation, Bethesda, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ; 324 / ;
Abstract

A calibration procedure for vector network analyzers utilizing a known standard, an unknown standard and a pair of offsets bearing a known length ratio (2:1) between them whereby measurements taken on the standards and their combinations with the offsets result in self-verifying redundant equations which furnish: (1) error terms according to well-known flow graph models, (2) the reflection of the unknown standard, (3) the transmission factor of the waveguiding medium from which the offsets are realized regardless of the waveguide's loss or dispersion, and (4) a figure of merit (corruption coefficient) for the quality of the acquired raw data without the necessity for computing the error terms, connecting verification standards or otherwise completing the calibration process.


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