The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1989

Filed:

Aug. 17, 1987
Applicant:
Inventor:

David Bach, Westborough, MA (US);

Assignee:

Amoco Corporation, Chicago, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
2504581 ; 2504611 ;
Abstract

An apparatus and method for delivering excitation radiation to a sample and collecting radiation emanating from the sample. The sample is placed in a deep well which consists of a wall and a bottom end closed by a membrane to form a sample recepticle. A GRIN lens is provided that has a first surface and a second surface, the second surface being inserted into the deep well. A point source of light on the first surface of the GRIN lens is conditioned by the lens and, subsequently, emanates from the second surface of the lens towards the membrane. Reflected, luminescent of fluorescent radiation from the sample is incident on the second surface of the lens, passes through the lens to emanate from the first surface toward collection means, a detector and any desired processing.


Find Patent Forward Citations

Bach, David. (1989). System for radiation detection using a graded index optic element (U.S. Patent No. 4853547). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4853547

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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