The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1989

Filed:

Apr. 22, 1986
Applicant:
Inventors:

Thomas L Marzetta, Bethel, CT (US);

Weng C Chew, Champaign, IL (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324371 ; 324366 ;
Abstract

A method and apparatus investigating a circumferential segment of a borehole with an array of elements, which in effect spatially samples the segment, is described whereby, with a single circumferentially oriented array of spaced-apart elements sufficient overlap can be synthesized so as to reduce artifacts attributable to the spatial sampling. Measurements derived from circumferentially successive elements are combined, such as by summing to establish a desired overlap. In the described embodiment to a single lateral array of small electrodes is used to inject survey currents into the borehole wall and each current is measured. Measurements derived from pairs of successive survey currents are then summed to provide the desired overlap.


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