The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 1989
Filed:
Jul. 13, 1987
Applicant:
Inventor:
Bengt H Tornblom, Vasteras, SE;
Assignee:
Tornbloms Kvalitetskontroll AB, Vasteras, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324232 ; 324242 ;
Abstract
An eddy current testing device for inspecting test objects, for example billets, with respect to surface defects, for example surface cracks, comprises at least one transducer/sensor, for example a surface transducer or surface transducer arrangement, which is made to scan the surface of the test object. The device is characterized in that the effect of harmless surface blemishes on the testing device is suppressed, at least partially, by compensating for the sensitivity characteristic, in the scan direction of the transducer/sensor, with respect to the surface defect.