The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1989

Filed:

Aug. 31, 1988
Applicant:
Inventors:

Boris F Kim, Pasadena, MD (US);

Joseph Bohandy, Columbia, MD (US);

Kishin Moorjani, Silver Spring, MD (US);

Frank J Adrain, Olney, MD (US);

Assignee:

The John Hopkins University, Baltimore, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324 716 ; 324 / ; 324 / ; 324233 ; 324316 ; 505843 ;
Abstract

The invention relates to a method and apparatus to detect the superconductive state by measuring the change in the resistance of a sample. A dc magnetic field is imposed on the sample while the temperature is swept. The strength of the magnetic field is held below the critical value and is frequency modulated by the application of an ac field in such a way that total magnetic field is always positive. The resistance of the sample is measured incrementally as the temperature is swept and is phase detected at the modulation frequency. According to this embodiment, only magnetic field dependent changes demonstrating a precipitous drop in resistance identify a composition as superconductive.


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