The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 1989
Filed:
Mar. 09, 1987
Frank J Yang, Salt Lake City, UT (US);
Paul B Farnsworth, Provo, UT (US);
Karin E Markides, Provo, UT (US);
Milton L Lee, Pleasant Grove, UT (US);
Ronald J Skelton Jr, Orem, UT (US);
Brigham Young University, Provo, UT (US);
Abstract
A method and apparatus for element specific detection in chromatogragphic eluents. The apparatus is comprised of a radio frequency discharge between electrodes in helium, and utilizes a low-resolution plasma emission spectrometer to monitor selected spectral emissions produced when the helium discharge decomposes and excites the atomic constituents in chromatographic column effluents. The spectrometer is tuned to an atomic emission line in the near-infrared portion of the spectrum, and the emission intensity from the discharge region of a selected line is used to monitor the concentration of the element producing that line. Acceptable detector sensitivity is achieved by the use of a high-throughput optical system. Selectivity is achieved by a combination of correct line selection, plasma and carrier gas purification, and plasma gas doping.