The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1989

Filed:

Jun. 06, 1986
Applicant:
Inventors:

Mark S Bowen, Medford, MA (US);

Michael L Broide, Cambridge, MA (US);

Richard J Cohen, Newton Highlands, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356336 ; 356338 ;
Abstract

A system for determining the cluster size distribution of submicron-size particles in a solution by optical pulse particle size analysis is provided. The system comprises a laminar flow cell having a translucent chamber, means for passing a sheath liquid and a sample liquid through the chamber, a light source and means for focusing the beam of light onto the chamber of the flow cell, a collecting lens, means for limiting collected light to a low angle, a stop, an iris, a light sensor and a means for processing the light signals. The system employs a combination of improved features which allows ultra-sensitive measurement of the cluster size distribution of particles, and can reliably detect as few as three dimers for every 10,000 monomers of micron size particles.


Find Patent Forward Citations

Loading…