The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 1989
Filed:
May. 23, 1988
Applicant:
Inventors:
Vance A Deason, Shelley, ID (US);
Michael B Ward, Idaho Falls, ID (US);
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356 355 ; 356354 ;
Abstract
A compact and portable moire interferometer used to determine surface deformations of an object. The improved interferometer is comprised of a laser beam, optical and fiber optics devices coupling the beam to one or more evanescent wave splitters, and collimating lenses directing the split beam at one or more specimen gratings. Observation means including film and video cameras may be used to view and record the resultant fringe patterns.