The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1989
Filed:
Dec. 30, 1987
Seymour Feinland, Stamford, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
A weighing instrument is provided with two sets of breakpoints; 'generic breakpoints' which fall at the midpoint of successive display intervals, and 'postal breakpoints' which fall at or near one of the two successive display intervals. Under 'normal' circumstances, the postal breakpoints are in place and the instrument is used as a 'weight classifier'. When it is sensed that the 'weighing history' of the instrument is such that weighing errors due to 'creep' will affect the accuracy of the instrument, and will be augmented by the bias inherent in the use of postal breakpoints, the generic breakprints are instituted. An example of a weighing history of a nature that the generic breakpoints should be implemented is the application of a 'large' weight (such as 75% of full range) to the instrument for a 'long' time (such as in excess of 30 seconds). The postal breakpoints are reimplemented in the instrument upon a return to substantially zero weight on the instrument. Method and apparatus are disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile