The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1989
Filed:
Jul. 14, 1987
Applicant:
Inventors:
Peter Van Der Meulen, Eindhoven, NL;
Filips Van Liere, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ;
Abstract
A method is proposed for the elimination of the effect of coherent interference signals which give rise to image artefacts in off-center imaging which usually requires roll correction in order to obtain a correct image. To this end, the image is shifted independently with respect to the artefact signal over an arbitrary distance which depends on the isocentric shift. The method is advantageous for off-center imaging where usually surface coils are used. A band of interference signals in the phase encoding direction can thus be shifted to the edge of the image.