The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 1989

Filed:

Feb. 29, 1988
Applicant:
Inventors:

James M Prince, Kennewick, WA (US);

Michael G Dodson, Richland, WA (US);

Wayne M Lechelt, Benton City, WA (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324227 ; 324233 ; 324243 ;
Abstract

A system for measuring the hardness of cartridge cases employs an eddy current probe for inducing and sensing eddy currents in each cartridge case. A first component of the sensed signal is utilized in a closed loop system for accurately positioning the probe relative to the cartridge case both in the lift off direction and in the tangential direction, and a second component of the sensed signal is employed as a measure of the hardness. The positioning and measurement are carried out under closed loop microprocessor control facilitating hardness testing on a production line basis.


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Prince, James. (1989). Automated measurement system employing eddy currents to adjust probe (U.S. Patent No. 4849693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4849693

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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