The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 1989

Filed:

Apr. 08, 1988
Applicant:
Inventor:

David J Mundy, San Diego, CA (US);

Assignee:

Eaton Leonard Technologies, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250560 ; 256376 ;
Abstract

An optical probe for measuring various parameters of bent pipe comprises a substantially U-shaped housing defining a sensitive area across which light is projected from within the housing toward first and second light sensors mounted to the legs of the probe and having fields of view directed toward the inner portion of the probe. A pipe positioned within the sensitive area of the probe occludes sections of the fields of view of the sensors, which occluded sections have a direct relation to the position of the pipe with respect to the probe. Positions of the occluded sections of the fields of view defines the position of the pipe relative to the probe. By moving the probe in a scanning path along the pipe, a large number of measurements are made so that a best fit line will effectively average a large number of measurements to more accurately define three dimensional position and orientation of the pipe centerline.


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