The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1989
Filed:
Dec. 21, 1987
Charles J Kramer, Pittsford, NY (US);
Halotek Ltd., Rochester, NY (US);
Abstract
A multi-wavelength (color--red(R)--blue(B)--green(G)) scanner system using diffraction grating deflector elements. A plurality of elements are used. Each has a different grating period. The elements all have the same lambda/D (wavelength to grating period) ratio. The elements are moved serially to intercept a composite, multi-wavelength beam. A preobjective lens is used to focus the successive, different wavelength beams to a single composite spot on an image surface. Since each element has the same lambda/D value, for a different wavelength, the spots from each wavelength will overlap and scan essentially colinear lines, successively, on the image surface. By moving the image surface an image area can be scanned. The composite spots and lines are used to read color images by measuring the spectrum of reflected light from the scanned image or may be used to generate color images by independently modulating individual sources of light comprising the beams and which make up the scanning spot.