The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 1989

Filed:

Dec. 22, 1987
Applicant:
Inventors:

Benjamin M Bartilson, Columbus, OH (US);

Kenneth D Kok, Columbus, OH (US);

Thomas A Pettenski, Columbus, OH (US);

Assignee:

Battelle Memorial Institute, Columbus, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
7386471 ;
Abstract

Apparatus for taking smear samples of the surface of objects for sampling radiation or chemical contamination levels. Both wiping area and pressure are controlled giving reliable, repeatable samples. A carriage provided with sampling strips is slideably mounted within a frame. Constant force springs pull the carriage across a known distance upon its release while a pressure roller on the carriage presses the sample strip to the area to be sampled. The sample strip is wound on a take-up reel as each sample is taken. The device is intended for remote or hazardous environments and may be operated manually or by robotics.


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