The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 1989
Filed:
Aug. 12, 1987
Michiko Tsurumaru, Tokyo, JP;
Yukio Suzuki, Kawasaki, JP;
Fumihiro Tsutsumi, Tokyo, JP;
Masato Ashina, Yokosuka, JP;
Hironori Kobayashi, Chofu, JP;
Toyo Seikan Kaisha, Ltd., Tokyo, JP;
Abstract
Disclosed is a method for measuring the metal exposure in a resin covering area of a metal container or a constituent member thereof, which comprises contacting the resin covering area of the metal container or the constituent member thereof with a measuring electrode through an electrolytic solution, relatively moving the resin covering area and the measuring electrode in a certain direction while always holding the electrolytic solution between the measuring electrode and the resin covering area, measuring a leak current between the metal substrate of the metal container or constituent member at predetermined pitches and detecting the metal exposure of the resin covering area as leak currents at respective parts discriminately. According to this measuring method, the degree of the metal exposure can be easily measured as the leak current at respective parts discriminately, and statistical processing of the measured leak current values can be easily performed.